Ir para o conteúdo
ECOS

Radiologia e Diagnóstico por Imagem

Item Tag: Chris Chatfield

Statistics for Technology: A Course in Applied Statistics, Third Edition

Statistics for Technology: A Course in Applied Statistics, Third Edition by Chatfield, Chris May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less

ECOS

Radiologia e Diagnóstico por Imagem

Todos os direitos reservados